Leen Biesemans

Microstructural evolution of cu interconnect under AC, pulsed DC and DC current stress

Kris Vanstreels, Jan D'Haen, Ward De Ceuninck, 2007 .

MTF test system with AC based dynamic joule correction for electromigration tests on interconnects

Kris Vanstreels, Jan D'Haen, Ward De Ceuninck, 2004, Microelectron. Reliab..