J. Klöber

Measurement of Low‐Temperature Cu Diffusion along Free‐Surface Short Circuits in Thin Ni Films

P. Schneider, H. Schneider, J. Klöber, 1986 .

Photoelastic characterization of residual strain in GaAs wafers annealed in holders of different geometry

M. Yamada, J. Niklas, M. Fukuzawa, 1999 .

Effects of thickness and additives on thin-film SnO2 gas sensors

M. Ludwig, H. Schneider, J. Klöber, 1991 .