M.H. Assaf

Revisiting response compaction in space for full scan circuits with nonexhaustive test sets using concept of sequence characterization

E.M. Petriu, S.R. Das, M.H. Assaf, 2003, Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412).

Verification of Ethernet IP Core MAC Design Using Deterministic Test Methodology

E.M. Petriu, S.R. Das, M.H. Assaf, 2008, 2008 IEEE Instrumentation and Measurement Technology Conference.

Promising Complex ASIC Design Verification Methodology

W.B. Jone, S.R. Das, M.H. Assaf, 2007, 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007.

Built-In Hardware for Analog Circuitry Testing

M.H. Assaf, M. Fathi, M. Assaf, 2008, 2008 Electronics, Robotics and Automotive Mechanics Conference (CERMA '08).

Space Compaction for Embedded Cores-Based System-on-Chips (SOCs) Using Fault Graded Output Merger

E.M. Petriu, S.R. Das, M.H. Assaf, 2007, 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007.

Space compression revisited

E.M. Petriu, K. Chakrabarty, M.H. Assaf, 1999, IMTC/99. Proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference (Cat. No.99CH36309).