Mike Hyatt

Simulation-based pattern matching using scanner metrology and design data to reduce reliance on CD metrology

Anton Devilliers, Junwei Lu, Xu Xie, 2010, Advanced Lithography.

Improving aberration control with application specific optimization using computational lithography

Peng Liu, Yuan He, Peter Engblom, 2010, Advanced Lithography.

Transport telematics: Vehicle technology - A tool for road safety

Mike Hyatt, 2003 .