Y.-D Chih

A High-Density MTP Cell With Contact Coupling Gates by Pure CMOS Logic Process

Chrong Jung Lin, Cheng-Wei Tsai, Haw-Yun Wu, 2011, IEEE Electron Device Letters.

High-K metal gate contact RRAM (CRRAM) in pure 28nm CMOS logic process

Ming-Jinn Tsai, Ya-Chin King, Shyh-Shyuan Sheu, 2012, 2012 International Electron Devices Meeting.

Memristor Logic Operation Gate With Share Contact RRAM Cell

Chrong Jung Lin, Y.-D Chih, Yuan Heng Tseng, 2011, IEEE Electron Device Letters.