Xiguang Li

Infrared reflectance study of 3C-SiC epilayers grown on silicon substrates

Xingfang Liu, Wanshun Zhao, Z. Wang, 2012 .

Determination of the transport properties in 4H-SiC wafers by Raman scattering measurement*

Xingfang Liu, Wanshun Zhao, Guosheng Sun, 2011 .

Characterization of 4H—SiC substrates and epilayers by Fourier transform infrared reflectance spectroscopy

Xingfang Liu, Wanshun Zhao, Z. Wang, 2012 .

Analysis and modeling of localized faceting on 4H‐SiC epilayer surfaces

Xingfang Liu, Z. Wang, Lin Dong, 2013 .

Growth of 4H-SiC epilayers with low surface roughness and morphological defects density on 4° off-axis substrates

Xingfang Liu, Yan Guoguo, Lin Dong, 2013 .

Mapping of micropipes and downfalls on 4H-SiC epilayers by Candela optical surface analyzer

Xingfang Liu, Lin Dong, Liu Zheng, 2012, 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology.