Ad J. van de Goor

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Said Hamdioui, Ad J. van de Goor, Rob Wadsworth, 2004, 2004 International Conferce on Test.
Ad J. van de Goor, Serge N. Demidenko, S. Henderson, 2001, Proceedings 10th Asian Test Symposium.
Said Hamdioui, Ad J. van de Goor, J. Delos Reyes, 2006 .
Said Hamdioui, Ad J. van de Goor, Zaid Al-Ars, 2002, Proceedings 20th IEEE VLSI Test Symposium (VTS 2002).
Ad J. van de Goor, Zaid Al-Ars, 2003, IEEE Trans. Computers.
Said Hamdioui, Ad J. van de Goor, Rob Wadsworth, 2004, J. Electron. Test..
Ad J. van de Goor, A. V. Goor, 1993, IEEE Des. Test Comput..
Ad J. van de Goor, Issam B. S. Tlili, 1997, Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125).
Yervant Zorian, Ad J. van de Goor, Ivo Schanstra, 1995, Proceedings the European Design and Test Conference. ED&TC 1995.
Ad J. van de Goor, G. J. Dekker, 1987, IEEE Micro.
Ad J. van de Goor, Zaid Al-Ars, 2000, Proceedings of the Ninth Asian Test Symposium.
Georgi Gaydadjiev, Ad J. van de Goor, G. Gaydadjiev, 1996, Proceedings of the Fifth Asian Test Symposium (ATS'96).
Said Hamdioui, Ad J. van de Goor, Zaid Al-Ars, 2004, Records of the 2004 International Workshop on Memory Technology, Design and Testing, 2004..
Reinder J. Bril, Ad J. van de Goor, 1988, Microprocess. Microsystems.
Ad J. van de Goor, Ivo Schanstra, A. V. Goor, 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).
Ad J. van de Goor, Ivo Schanstra, A. V. Goor, 2002, Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002.
Ad J. van de Goor, Zaid Al-Ars, 2003, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
Said Hamdioui, Ad J. van de Goor, Mike Rodgers, 2003, Proceedings. 21st VLSI Test Symposium, 2003..
Said Hamdioui, Ad J. van de Goor, Halil Kukner, 2011, 2011 IEEE International Test Conference.
Said Hamdioui, Ad J. van de Goor, Mike Rodgers, 2002, Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002).
Said Hamdioui, Ad J. van de Goor, Zaid Al-Ars, 2003, 2003 Test Symposium.
Ad J. van de Goor, 1989, Electronic systems engineering series.
Said Hamdioui, Ad J. van de Goor, 2002, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
Ad J. van de Goor, P. C. M. van der Arend, Gert-Jan Tromp, 1991, 1991, Proceedings. International Test Conference.
Georgi Gaydadjiev, Vyacheslav N. Yarmolik, Ad J. van de Goor, 1996, Proceedings of 14th VLSI Test Symposium.
Said Hamdioui, Georgi Gaydadjiev, Ad J. van de Goor, 2009, 2009 Asian Test Symposium.
Ad J. van de Goor, J. E. Simonse, 1999, Proceedings Eighth Asian Test Symposium (ATS'99).
Said Hamdioui, Ad J. van de Goor, Rob Wadsworth, 2005, 2005 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'05).
Ad J. van de Goor, Vlad. Hert, 1991, Fault-Tolerant Computing Systems.
Ad J. van de Goor, Petra De Jong, 1988, IEEE Trans. Computers.
Ad J. van de Goor, Issam B. S. Tlili, 1998, Proceedings Design, Automation and Test in Europe.
Said Hamdioui, Ad J. van de Goor, A. V. Goor, 2000, Proceedings of the Ninth Asian Test Symposium.
Ad J. van de Goor, A. Paalvast, 2000, Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159).
Ad J. van de Goor, Gert-Jan Tromp, 1991, [1991 Proceedings] IEEE International Conference on Computer Design: VLSI in Computers and Processors.
Ad J. van de Goor, Zaid Al-Ars, Martin Herzog, 2004, Records of the 2004 International Workshop on Memory Technology, Design and Testing, 2004..
Said Hamdioui, Georgi Gaydadjiev, Ad J. van de Goor, 2010, 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010).
Zaid Al-Ars, Ad J. van de Goor, 2000, Proceedings 18th IEEE VLSI Test Symposium.
Said Hamdioui, Ad J. van de Goor, A. V. Goor, 1998, Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231).
Mark G. Karpovsky, Vyacheslav N. Yarmolik, Ad J. van de Goor, 1995, Proceedings the European Design and Test Conference. ED&TC 1995.
Ad J. van de Goor, 1998, Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259).
Ad J. van de Goor, Mike Lin, A. V. Goor, 1997, Proceedings International Test Conference 1997.
Said Hamdioui, Ad J. van de Goor, Zaid Al-Ars, 2005, Design, Automation and Test in Europe.
Ad J. van de Goor, Zaid Al-Ars, 2002, Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02)..
Ad J. van de Goor, A. Moolenaar, 1988, USENIX Winter.
Vyacheslav N. Yarmolik, Ad J. van de Goor, V. G. Mikitjuk, 1996, Proceedings ED&TC European Design and Test Conference.
Said Hamdioui, Ad J. van de Goor, Zaid Al-Ars, 2004, 22nd IEEE VLSI Test Symposium, 2004. Proceedings..
Said Hamdioui, Ad J. van de Goor, 2010, 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems.
Ad J. van de Goor, Zaid Al-Ars, 2002, Proceedings 20th IEEE VLSI Test Symposium (VTS 2002).
Said Hamdioui, Georgi Gaydadjiev, Ad J. van de Goor, 2004, Records of the 2004 International Workshop on Memory Technology, Design and Testing, 2004..
Said Hamdioui, Ad J. van de Goor, Zaid Al-Ars, 2004, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
Ad J. van de Goor, Ivo Schanstra, Aad Offerman, 1996, Proceedings ED&TC European Design and Test Conference.
Said Hamdioui, Ad J. van de Goor, Zaid Al-Ars, 2008, 2008 IEEE International Test Conference.
Ad J. van de Goor, Ivo Schanstra, Kees Veelenturf, 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).
Ad J. van de Goor, 2004, IEEE Des. Test Comput..
Ad J. van de Goor, B. Smit, 1994, Proceedings., International Test Conference.
Ad J. van de Goor, 1984, Comput. Secur..
Said Hamdioui, Ad J. van de Goor, Mike Rodgers, 2001, Proceedings 10th Asian Test Symposium.
Ad J. van de Goor, M. J. Geuzebroek, J. Th. van der Linden, 2000, Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159).
Ad J. van de Goor, Zaid Al-Ars, 2004, Proceedings Design, Automation and Test in Europe Conference and Exhibition.
Ad J. van de Goor, Zaid Al-Ars, 2003, Records of the 2003 International Workshop on Memory Technology, Design and Testing.
Ad J. van de Goor, Matthias Klaus, A. V. Goor, 2001, Proceedings 10th Asian Test Symposium.
Said Hamdioui, Ad J. van de Goor, 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).
Said Hamdioui, Georgi Gaydadjiev, Ad J. van de Goor, 2006, 2006 IEEE International Test Conference.
Ad J. van de Goor, J. de Neef, 1999, DATE '99.
Ad J. van de Goor, Zaid Al-Ars, Detlev Richter, 2003, 2003 Design, Automation and Test in Europe Conference and Exhibition.
Said Hamdioui, Ad J. van de Goor, 2010, 2010 5th International Design and Test Workshop.
Said Hamdioui, Ad J. van de Goor, Zaid Al-Ars, 2004, Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004..
Yervant Zorian, Ad J. van de Goor, Ivo Schanstra, 1994, Proceedings of IEEE VLSI Test Symposium.
Mario H. Konijnenburg, Ad J. van de Goor, J. Th. van der Linden, 1997, Proceedings International Test Conference 1997.
Ad J. van de Goor, R. D. L. Stout, R. E. Wolff, 1998, Microprocess. Microsystems.
Ad J. van de Goor, T. A. Peelen, 1987, Microprocess. Microsystems.
Said Hamdioui, Ad J. van de Goor, Sultan M. Al-Harbi, 2006, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
Ad J. van de Goor, Ivo Schanstra, 2003, 2003 Design, Automation and Test in Europe Conference and Exhibition.
Yervant Zorian, Ad J. van de Goor, Ivo Schanstra, 1994, Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC.
Ad J. van de Goor, Zaid Al-Ars, 2002, Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition.
Said Hamdioui, Ad J. van de Goor, Zaid Al-Ars, 2006, Proceedings of the Design Automation & Test in Europe Conference.
Ad J. van de Goor, Zaid Al-Ars, Detlev Richter, 2001, Proceedings 10th Asian Test Symposium.
Said Hamdioui, Ad J. van de Goor, R. Wadsworth, 2004 .
Mario H. Konijnenburg, Ad J. van de Goor, J. Th. van der Linden, 1993, Proceedings of IEEE International Test Conference - (ITC).
Ad J. van de Goor, A. C. van Wijngaarden, 1987, Microprocess. Microsystems.
Ad J. van de Goor, M. J. Geuzebroek, J. Th. van der Linden, 2002, Proceedings. International Test Conference.
Mario H. Konijnenburg, Ad J. van de Goor, J. Th. van der Linden, 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).
Yervant Zorian, Ad J. van de Goor, Ivo Schanstra, 1994, Proceedings., International Test Conference.
Mario H. Konijnenburg, Ad J. van de Goor, J. Th. van der Linden, 1996, Proceedings of the Fifth Asian Test Symposium (ATS'96).
Mario H. Konijnenburg, Ad J. van de Goor, J. Th. van der Linden, 1999, Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078).
Michael J. Flynn, Ad J. van de Goor, Fabian Klass, 1994, Proceedings of IEEE International Symposium on Circuits and Systems - ISCAS '94.
Said Hamdioui, Ad J. van de Goor, Mike Rodgers, 2000, Records of the IEEE International Workshop on Memory Technology, Design and Testing.
Said Hamdioui, Ad J. van de Goor, A. V. Goor, 2002, IEEE Trans. Computers.
Ad J. van de Goor, J. K. Annot, M. D. Janssens, 1986, CACM.
Zaid Al-Ars, Said Hamdioui, Ad J. van de Goor, 2003, J. Electron. Test..
Ad J. van de Goor, Zaid Al-Ars, 2001, Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing.
Ad J. van de Goor, M. J. Geuzebroek, A. V. Goor, 2003, The Eighth IEEE European Test Workshop, 2003. Proceedings..
Georgi Gaydadjiev, Vyacheslav N. Yarmolik, Ad J. van de Goor, 1997, Proceedings European Design and Test Conference. ED & TC 97.
Said Hamdioui, Ad J. van de Goor, Rob Wadsworth, 2003, The Eighth IEEE European Test Workshop, 2003. Proceedings..
Said Hamdioui, Ad J. van de Goor, 1998, Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259).
Mario H. Konijnenburg, Ad J. van de Goor, J. Th. van der Linden, 1994, Proceedings of IEEE VLSI Test Symposium.
Ad J. van de Goor, Th. J. W. Verhallen, 1992, Proceedings International Test Conference 1992.
Mario H. Konijnenburg, Ad J. van de Goor, J. Th. van der Linden, 1995, Proceedings 13th IEEE VLSI Test Symposium.
Ad J. van de Goor, C. A. Verruijt, A. V. Goor, 1990, CSUR.
Said Hamdioui, Ad J. van de Goor, 1999, Proceedings Eighth Asian Test Symposium (ATS'99).
Said Hamdioui, Georgi Gaydadjiev, Ad J. van de Goor, 2010, 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems.
Said Hamdioui, Ad J. van de Goor, 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).
Said Hamdioui, Ad J. van de Goor, Zaid Al-Ars, 2006, IEEE Transactions on Computers.
Said Hamdioui, Ad J. van de Goor, Zaid Al-Ars, 2003, Records of the 2003 International Workshop on Memory Technology, Design and Testing.
Magdy S. Abadir, Ad J. van de Goor, Alan Carlin, 2002, Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition.
Ad J. van de Goor, B. Smit, A. V. Goor, 1994, Proceedings of IEEE VLSI Test Symposium.
Ad J. van de Goor, Zaid Al-Ars, 2001, Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001.
Mario H. Konijnenburg, Ad J. van de Goor, J. Th. van der Linden, 1996, ITC.
Ad J. van de Goor, Daniel P. Van der Velde, 1999, MTDT.
Mario H. Konijnenburg, Ad J. van de Goor, J. Th. van der Linden, 1994, Proceedings., International Test Conference.
Said Hamdioui, Georgi Gaydadjiev, Ad J. van de Goor, 2010, 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems.
Henk Corporaal, Ad J. van de Goor, 1989, MICRO 22.
Ad J. van de Goor, J. Th. van der Linden, Mario H. Konijnenburg, 1998, Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259).