Miltiadis Poursanidis

Move-to-Data: A new Continual Learning approach with Deep CNNs, Application for image-class recognition pdf

Boris Mansencal, Jenny Benois-Pineau, Aymar de Rugy, 2020, ArXiv.

Capturing and incorporating expert knowledge into machine learning models for quality prediction in manufacturing

S. Ihlenfeldt, U. Teicher, Patrick Link, 2022, Journal of Intelligent Manufacturing.