Carol Q. Tong

发表

Resolution Enhancement in IDDQ Testingfor Large ICs

Yashwant K. Malaiya, S. M. Menon, Anura P. Jayasumana, 1994 .

Enhancement of resolution in supply current based testing for large ICs

Anura P. Jayasumana, Yashwant K. Malaiya, Sankaran M. Menon, 1991, Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's.

Detection of multiple faults using SSFTS in CMOS logic circuits

Ding Lu, Carol Q. Tong, 1993, Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS).

Operational and Test Performance in the Presence of Built-in Current Sensors

Yashwant K. Malaiya, S. M. Menon, Anura P. Jayasumana, 1997, VLSI Design.

Multiple fault detection in CMOS logic circuits

Ding Lu, Carol Q. Tong, 1992, Proceedings 1992 IEEE International Conference on Computer Design: VLSI in Computers & Processors.

Detection of multiple faults using SSFTS in CMOS logic circuits

Ding Lu, Carol Q. Tong, 1995 .

Detection of multiple input bridging and stuck-on faults in CMOS logic circuits using current monitoring

Niraj K. Jha, Carol Q. Tong, 1990, Proceedings of the European Design Automation Conference, 1990., EDAC..

High level fault modeling of asynchronous circuits

Ding Lu, Carol Q. Tong, 1995, Proceedings 13th IEEE VLSI Test Symposium.

Digest of papers : 1996 IEEE International Workshop on IDDQ Testing, October 24-25, 1996, Washington, D.C.

Anura P. Jayasumana, Carol Q. Tong, A. Jayasumana, 1996 .

Resolution Enhancement in Iooo for Large ICs*t Testing

S. M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya, 1994 .

Built-in current self-testing scheme (BICST) for CMOS logic circuits

Carol Q. Tong, C. Tong, 1992, Digest of Papers. 1992 IEEE VLSI Test Symposium.

Faulty behavior of asynchronous storage elements

Anura P. Jayasumana, Yashwant K. Malaiya, Ding Lu, 1993 .

Design of robustly testable static CMOS parity trees derived from binary decision diagrams

Niraj K. Jha, Carol Q. Tong, 1990, Proceedings., 1990 IEEE International Conference on Computer Design: VLSI in Computers and Processors.

The effect of built-in current sensors (BICS) on operational and test performance /spl lsqb/CMOS ICs/spl rsqb/

Anura P. Jayasumana, Yashwant K. Malaiya, Sankaran M. Menon, 1994, Proceedings of 7th International Conference on VLSI Design.