Hede Ma

Pattern recognition using ω-orbit finite automata

Ying Liu, Hede Ma, 1991, Other Conferences.

Fault isolation in grey systems

Stephen Y. H. Su, Hede Ma, 1988, International Test Conference 1988 Proceeding@m_New Frontiers in Testing.

Efficient fault isolation schemes for gray digital systems

Hede Ma, 1990 .

Pattern recognition using Boltzmann machine

Hede Ma, 1995, Proceedings IEEE Southeastcon '95. Visualize the Future.

Designs for diagnosability and reliability in VLSI systems

Stephen Y. H. Su, Hede Ma, 1988, International Test Conference 1988 Proceeding@m_New Frontiers in Testing.

Comparison between image analysis using class 2 and class 3 dynamical systems

Ying Liu, Hede Ma, Y. Liu, 1992, Electronic Imaging.