Zhen Shi

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Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic System Assembly

Zhen Shi, Peter Sandborn, P. Sandborn, 2006, J. Electron. Test..

Optimization of test/diagnosis/rework location(s) and characteristics in electronic systems assembly using real-coded genetic algorithms

Zhen Shi, Peter Sandborn, P. Sandborn, 2003, International Test Conference, 2003. Proceedings. ITC 2003..