K. Hirayama

X-ray CTR scattering measurement of InP/InGaAs/InP interface structures fabricated by different growth processes

Y. Shimogaki, Y. Nakano, M. Tabuchi, 2000 .

Impacts of KF Post-Deposition Treatment on the Band Alignment of Epitaxial Cu(In,Ga)Se2 Heterojunctions.

S. Ishizuka, S. Niki, Shinho Kim, 2022, ACS applied materials & interfaces.

Characterization of initial growth stage of GaInN multi-layered structure by X-ray CTR scattering method

H. Amano, I. Akasaki, T. Takeuchi, 2000 .