Rahul Singhal

Novel Technique for Manufacturing & In-system Testing of Large Scale SoC using Functional Protocol Based High-Speed I/O

Amit R. Pandey, Brendan Tully, Abhijeet Samudra, 2022, 2022 IEEE 40th VLSI Test Symposium (VTS).

Tutorial 1B: AI Chip Technologies and DFT Methodologies

Rahul Singhal, Yu Huang, Yu Huang, 2019, SoCC.

Case study on low pin count testing of industry transceiver chip

Imtiaz Ahmed, Rahul Singhal, Subhash Baraiya, 2018, 2018 IEEE 27th North Atlantic Test Workshop (NATW).

Access Control for Cloud Platforms Using Multi-Tier Graphical Authentication

Namrata Singh, Amanpreet Kaur, Navdeep Kaur, 2015 .

Novel Technique for Manufacturing, System-Level, and In-System Testing of Large SoC Using Functional Protocol-Based High-Speed I/O

Brendan Tully, Abhijeet Samudra, Ajay Nagarandal, 2023, IEEE Design & Test.

A Case Study of Testing Strategy for AI SoC

Wu Yang, Yu Huang, Xin Wen, 2019, 2019 IEEE International Test Conference in Asia (ITC-Asia).