N. I. Deligiannis

发表

Riccardo Cantoro, Matteo Sonza Reorda, Emanuele Valea, 2020, 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).

M. Reorda, B. Becker, I. Polian, 2023, 2023 IEEE European Test Symposium (ETS).