SungSoon Choi

发表

Reliability Prediction Approach of DC-DC Converter with Electrical Stress Analysis

Jemin Kim, KwanHun Lee, SungSoon Choi, 2014 .

Accelerated Power Cycling Life Test of IGBT Module

Wooyoung Lee, KwanHun Lee, SungSoon Choi, 2014 .

Power cycling test of power semiconductor based on junction temperature monitoring

Byungjin Ma, SungSoon Choi, Kwan-Hun Lee, 2014, 20th International Workshop on Thermal Investigations of ICs and Systems.

Failure analysis of P-N junction degradation by high temperature reverse bias operating condition

SungSoon Choi, Kwanhoon Lee, Sungsoon Choi, 2013, Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).