E. R. Minami

A new bi-directional PMOSFET hot-carrier degradation model for circuit reliability simulation

Chenming Hu, C. C. Li, K. N. Quader, 1992, 1992 International Technical Digest on Electron Devices Meeting.

Berkeley reliability tools-BERT

Elyse Rosenbaum, Ping-Keung Ko, Chenming Hu, 1993, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Simulating radiation reliability with BERT

Paolo Pavan, Ping Keung Ko, Chenming Hu, 1995 .

Prediction of hot-carrier degradation in digital CMOS VLSI by timing simulation

Chenming Hu, K. N. Quader, E. R. Minami, 1992, 1992 International Technical Digest on Electron Devices Meeting.

Hot-carrier-reliability design guidelines for CMOS logic circuits

Wei-Jen Huang, Chenming Hu, K. N. Quader, 1993 .

A complete radiation reliability software simulator

Paolo Pavan, Chenming Hu, E. R. Minami, 1994 .

Circuit-level simulation of TDDB failure in digital CMOS circuits

Elyse Rosenbaum, Ping-Keung Ko, Chenming Hu, 1995 .