Y. Gohou
发表
Ryutaro Yasuhara,
Takashi Ono,
Reiji Mochida,
2018,
2018 IEEE Symposium on VLSI Technology.
Ryutaro Yasuhara,
Takashi Ono,
Reiji Mochida,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
Ryutaro Yasuhara,
Takashi Ono,
Reiji Mochida,
2019,
2019 IEEE 11th International Memory Workshop (IMW).
S. Iwanari,
H. Hirano,
T. Nakakuma,
2005,
IEEE Journal of Solid-State Circuits.