J.-P. Han
发表
R. Jordan,
G. W. Burr,
M. BrightSky,
2015,
2015 IEEE International Electron Devices Meeting (IEDM).
S. Ambrogio,
A. Sebastian,
T. Yamashita,
2021,
2021 IEEE International Reliability Physics Symposium (IRPS).
S. Ambrogio,
K. Suu,
J. Bruley,
2019,
2019 Symposium on VLSI Technology.