J. K. Wu

The study of phase angle effects to wafer process window using 193-nm EAPSM in a 300-mm wafer manufacturing environment

Gong Chen, Susan S. MacDonald, William Y. Chou, 2004, Photomask Japan.

Extended multiscale finite element method for elasto-plastic analysis of 2D periodic lattice truss materials

J. K. Wu, J. Wu, H. W. Zhang, 2010 .