Yamaguchi Shinji

Characterization of textured SnO2:F layers by ellipsometry using glass-side illumination

H. Fujiwara, Sugimoto Yoshio, Yamaguchi Shinji, 2013 .

Ellipsometry analysis of a-Si:H solar cell structures with submicron-size textures using glass-side illumination

H. Fujiwara, Sugimoto Yoshio, Yamaguchi Shinji, 2014 .