Rex Liu

Stable and expressive recurrent vision models pdf

Thomas Serre, Drew Linsley, Lakshmi Narasimhan Govindarajan, 2020, NeurIPS.

Advanced combined overlay and CD uniformity measurement mark for double patterning

Boris Habets, Stefan Buhl, Manuela Gutsch, 2018, Advanced Lithography.

BWCNN: Blink to Word, a Real-Time Convolutional Neural Network Approach

Ilias Tagkopoulos, Xiaoxiao Wang, Xin Liu, 2020, ICIOT.

Higher order intra-field alignment for intra-wafer lens and reticle heating control

Boris Habets, Charlie Chen, Patrick Lomtscher, 2018, Advanced Lithography.