J. Soden

CMOS IC fault models, physical defect coverage, and I/sub DDQ/ testing

Charles F. Hawkins, R. R. Fritzemeier, J. Soden, 1991, Proceedings of the IEEE 1991 Custom Integrated Circuits Conference.

Reliability, Test, and IDDe Measurements

Ali Keshavarzi, Charles F. Hawkins, J. Soden, 1997 .