D. C. Joy

发表

Miniature Scanning Electron Microscope for In-Situ Planetary Studies: Electron Gun Development

E. H. Darlington, J. G. Gaskin, G. A. Jerman, 2009 .

Improved Accuracy For SEM Linewidth Measurements

D. K. Atwood, D. C. Joy, 1987, Advanced Lithography.

Nanoscale Science, Engineering and Technology Research Directions

G. W. Crabtree, A. Majumdar, J. Barhen, 1999 .

Analytical electron microscopy : proceedings of a workshop held at Bethlehem, Pennsylvania, 16-20 July 1984

D. C. Joy, D. B. Williams, 1984 .

Fast Fourier Transform Techniques for Measuring SEM Resolution

D. C. Joy, A. Dodson, 1990 .

Fouling mechanisms of membranes during protein ultrafiltration

Anthony G. Fane, D. C. Joy, C.J.D. Fell, 1992 .

Scanning Electron Microscopy for Quantitative Small and Large Deformation Measurements Part I: SEM Imaging at Magnifications from 200 to 10,000

Michael A. Sutton, Xiaodong Li, D. C. Joy, 2007 .

Fabrication of a Fresnel zone plate through electron beam lithographic process and its application to measuring of critical dimension scanning electron microscope performance

Soo-Young Lee, D. C. Joy, J Kim, 2007 .

Low-voltage scanning electron microscopy of polymers

D. C. Joy, Stephen Krause, D. Joy, 1986 .