Ken Shono

ed Highly Reliable GaN HEMTs on Si S

Douglas, Peter Smith, Umesh K. Mishra, 2014 .

650 V Highly Reliable GaN HEMTs on Si Substrates over Multiple Generations: Matching Silicon CMOS Manufacturing Metrics and Process Control

Zhan Wang, Kurt Smith, Primit Parikh, 2016, 2016 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS).

Invited) 650 Volt GaN Commercialization Reaches Automotive Standards

Josep M. Guerrero, Primit Parikh, J. Gritters, 2017 .

Commercialization and reliability of 600 V GaN power switches

Peter Smith, Kurt Smith, Umesh K. Mishra, 2015, 2015 IEEE International Reliability Physics Symposium.

650 Volt GaN Quality and Reliability- Readiness for Automotive Applications

Primit Parikh, Ken Shono, Yoshimori Asai, 2017 .

600 V JEDEC-qualified highly reliable GaN HEMTs on Si substrates

Primit Parikh, Toshihide Kikkawa, Kenji Imanishi, 2014, 2014 IEEE International Electron Devices Meeting.