Karim Tobich

Voltage Spikes on the Substrate to Obtain Timing Faults

Philippe Maurine, Pierre-Yvan Liardet, Mathieu Lisart, 2013, 2013 Euromicro Conference on Digital System Design.

Evidence of a Larger EM-Induced Fault Model

Jean-Max Dutertre, Philippe Maurine, Sébastien Ordas, 2014, CARDIS.

Machine learning and side channel analysis in a CTF competition

Chen Zhang, Werner Schindler, Yongbo Hu, 2019, IACR Cryptol. ePrint Arch..

Yet Another Fault Injection Technique : by Forward Body Biasing Injection

Philippe Maurine, Pierre Yvan Liardet, Thomas Ordas, 2012 .

An Industrial Outlook on Challenges of Hardware Security in Digital Economy - Extended Abstract -

Shivam Bhasin, Victor Lomné, Karim Tobich, 2017, SPACE.

Electromagnetic analysis, deciphering and reverse engineering of integrated circuits (E-MATA HARI)

Bruno Robisson, Philippe Maurine, Rachid Omarouayache, 2014, 2014 22nd International Conference on Very Large Scale Integration (VLSI-SoC).

Efficiency of a glitch detector against electromagnetic fault injection

Jean-Max Dutertre, Philippe Maurine, Assia Tria, 2014, 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Local and Direct EM Injection of Power Into CMOS Integrated Circuits

Bruno Robisson, Philippe Maurine, Laurent Chusseau, 2011, 2011 Workshop on Fault Diagnosis and Tolerance in Cryptography.