P. Fontaine

发表

Octadecyltrichlorosilane monolayers as ultrathin gate insulating films in metal‐insulator‐semiconductor devices

D. Vuillaume, D. Deresmes, D. Goguenheim, 1993 .

Characterization of scanning tunneling microscopy and atomic force microscopy-based techniques for nanolithography on hydrogen-passivated silicon

Emmanuel Dubois, E. Dubois, D. Stiévenard, 1998 .

NANOOXIDATION USING A SCANNING PROBE MICROSCOPE : AN ANALYTICAL MODEL BASED ON FIELD INDUCED OXIDATION

Emmanuel Dubois, E. Dubois, D. Stiévenard, 1997 .