S. Ozawa

A New Technique to Produce Clean and Thin Silicon Films In Situ in a UHV Electron Microscope for TEM-TED Studies of Surfaces

Y. Tanishiro, K. Yagi, Kunio Kobayashi, 1990 .

UHV-TEM-REM Studies of Si(111) Surfaces

Hiroaki Sato, Y. Tanishiro, K. Yagi, 1991 .

High-Resolution Reflection Electron Microscopy of Si(111)7×7 Surfaces Using a High-Voltage Electron Microscope

K. Yagi, Kunio Kobayashi, H. Koike, 1989 .