Yu-Shen Yang
发表
Masahiro Fujita,
Andreas G. Veneris,
Yu-Shen Yang,
2012,
17th Asia and South Pacific Design Automation Conference.
Andreas G. Veneris,
Zissis Poulos,
Yu-Shen Yang,
2013,
2013 IEEE 19th International On-Line Testing Symposium (IOLTS).
Robert K. Brayton,
Andreas Veneris,
Yu-Shen Yang,
2011
.
Andreas G. Veneris,
Yu-Shen Yang,
Nicola Nicolici,
2012,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Andreas G. Veneris,
Yu-Shen Yang,
Nicola Nicolici,
2009,
2009 Design, Automation & Test in Europe Conference & Exhibition.
Yiorgos Makris,
Andreas Veneris,
Yu-Shen Yang,
2006
.
Yu-Shen Yang,
2010
.
Andreas G. Veneris,
Zissis Poulos,
Yu-Shen Yang,
2014,
Fifteenth International Symposium on Quality Electronic Design.
Robert K. Brayton,
Andreas G. Veneris,
Yu-Shen Yang,
2011,
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
Andreas G. Veneris,
Paul J. Thadikaran,
Yu-Shen Yang,
2006,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Andreas G. Veneris,
Paul J. Thadikaran,
Jiang Brandon Liu,
2003,
International Test Conference, 2003. Proceedings. ITC 2003..
Andreas G. Veneris,
Yiorgos Makris,
Yu-Shen Yang,
2008,
2008 14th IEEE International On-Line Testing Symposium.
Andreas G. Veneris,
Paul J. Thadikaran,
Jiang Brandon Liu,
2003,
Proceedings. 4th International Workshop on Microprocessor Test and Verification - Common Challenges and Solutions.
Robert K. Brayton,
Andreas G. Veneris,
Yu-Shen Yang,
2007,
2007 Asia and South Pacific Design Automation Conference.
Extraction error modeling and automated model debugging in high-performance low power custom designs
Andreas G. Veneris,
Paul J. Thadikaran,
Yu-Shen Yang,
2005,
Design, Automation and Test in Europe.
Andreas G. Veneris,
Zissis Poulos,
Jason Helge Anderson,
2012,
2012 Design, Automation & Test in Europe Conference & Exhibition (DATE).
Sean Safarpour,
Andreas G. Veneris,
Yu-Shen Yang,
2010,
2010 11th International Symposium on Quality Electronic Design (ISQED).
Andreas G. Veneris,
Yiorgos Makris,
Yu-Shen Yang,
2006,
2006 IEEE International Test Conference.
Robert K. Brayton,
Andreas G. Veneris,
Yu-Shen Yang,
2009,
2009 Design, Automation & Test in Europe Conference & Exhibition.