Masaru Sanada

发表

Defect Detection from Visual Abnormalities in Manufacturing Process Using IDDQ

Masaru Sanada, 2001, J. Electron. Test..

A CAD-based approach to failure diagnosis of CMOS LSI's using abnormal Iddq

Masaru Sanada, 1996, Proceedings of 14th VLSI Test Symposium.

Evaluation and detection of CMOS-LSI with abnormal IDDQ

Masaru Sanada, 1995 .

Layout-Based Detection Technique of Line Pairs with Bridging Fault Using IDDQ

Masaru Sanada, 2004, IEICE Trans. Inf. Syst..

Title Voltage-Based Fault Path Tracing by Transistor Operating Point Analysis Author

Masaru Sanada, 2008 .

Voltage-based fault path tracing by transistor operating point analysis

Masaru Sanada, 2008, Microelectron. Reliab..

Fault diagnosis technology using IDDQ and linkage of diagnosed result to the wafer inspection data : Technologies supporting semiconductor scientific manufacturing : Process monitoring, testing, failure analysis and reliability

Masaru Sanada, Kazuo Uehira, Eigo Fuse, 2000 .