Srinivas Kumar Vooka

发表

A Silicon Testing Strategy for Pulse-Width Failures

Ramakrishnan Venkatraman, Abhijeet Shrivastava, Srinivas Kumar Vooka, 2012, 2012 25th International Conference on VLSI Design.

Power Analysis and Reduction Techniques for Transition Fault Testing

Srivaths Ravi, Rubin A. Parekhji, Srinivas Kumar Vooka, 2008, 2008 17th Asian Test Symposium.

Enhancements in Deterministic BIST Implementations for Improving Test of Complex SOCs

Rubin A. Parekhji, Amit Dutta, Sandeep Jain, 2007, 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07).

At-speed Testing of Asynchronous Reset De-assertion Faults

Arvind Jain, Neeraj Pradhan, Srinivas Kumar Vooka, 2012, 2012 25th International Conference on VLSI Design.