Yuriy O. Kulanchikov

Charging Effects in Al-SiO2-p-Si Structures After Low-Energy Electron Beam Irradiation

E. Yakimov, P. S. Vergeles, Yuriy O. Kulanchikov, 2020, Journal of Electronic Materials.

Investigation of the Effect of Irradiation by a Low-Energy Electron Beam on the Capacitance–Voltage Characteristics of SiO2

E. Yakimov, P. S. Vergeles, Yuriy O. Kulanchikov, 2021, Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques.

Effect of low-energy electron irradiation on voltage-capacity curves of Al/SiO2/Si structure

E. Yakimov, P. S. Vergeles, Yuriy O. Kulanchikov, 2019, Modern Electronic Materials.