J. Oonishi

发表

High resolution in situ Li depth profiling of thin films stacked Li ion batteries under charging conditions by means of TERD and RBS techniques with 5 MeV He+2 ion beam

B. Tsuchiya, Y. Iriyama, K. Morita, 2018, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.