K. Rhew

Reliability assessment of 1.55-µm vertical cavity surface emitting lasers with tunnel junction using high-temperature aging tests

Ilgu Yun, Dae Hee Lee, Byueng-Su Yoo, 2009, Microelectron. Reliab..

Investigation of Reflow Effect and Empirical Lifetime Modeling on the Board Level Solder Joint Reliability

Kwangwon Seo, Yuchul Hwang, K. Rhew, 2022, 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC).