E. Materna Mikmeková

Quantification of STEM Images in High Resolution SEM for Segmented and Pixelated Detectors

I. Müllerová, I. Konvalina, M. Zouhar, 2021, Nanomaterials.

In-Lens Band-Pass Filter for Secondary Electrons in Ultrahigh Resolution SEM

I. Müllerová, I. Konvalina, F. Mika, 2019, Materials.

Low-energy electron microscopy of graphene outside UHV: electron-induced removal of PMMA residues used for graphene transfer

M. Lejeune, I. Müllerová, L. Frank, 2020 .

In-Lens Band-Pass Filter for Secondary Electrons in Ultrahigh Resolution SEM

I. Müllerová, I. Konvalina, F. Mika, 2019, Materials.

Deep Learning-Powered Optical Microscopy for Steel Research

Š. Mikmeková, I. Konvalina, M. Zouhar, 2024, Machine Learning and Knowledge Extraction.