H. Mori

发表

Y. Sano, Yokota Masahiro, T. Kojima, 1998 .

Naoki Kasai, Ichiro Yamamoto, K. Koyama, 1997, 1997 IEEE International Conference on Microelectronic Test Structures Proceedings.

Toshiro Itani, Kunihiko Kasama, T. Murotani, 1995 .

Hiroki Koike, Yoshihiro Hayashi, J. Yamada, 1998, 1998 Symposium on VLSI Technology Digest of Technical Papers (Cat. No.98CH36216).

Hiroki Koike, J. Yamada, H. Toyoshima, 2000, International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138).

I. Naritake, T. Murotani, T. Sugibayashi, 1995, Proceedings ISSCC '95 - International Solid-State Circuits Conference.

N. Kasai, H. Mori, N. Inoue, 1999, International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318).