M. Doulcier

Self-Test Techniques for Crypto-Devices

Giorgio Di Natale, Bruno Rouzeyre, Marie-Lise Flottes, 2010, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Low-Cost Self-Test of Crypto Devices

Bruno Rouzeyre, G. Di Natale, Marion Doulcier, 2008 .

AES-Based BIST: Self-Test, Test Pattern Generation and Signature Analysis

Bruno Rouzeyre, Marie-Lise Flottes, M. Doulcier, 2008, 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008).

Assume that for the th update of the backtracking, filling 's in and through is assign-compatible, as such, we can prove that filling 's in the previous patterns and through is also assign-compatible.

Giorgio Di Natale, Bruno Rouzeyre, Marie-Lise Flottes, 2010 .