Le Jin

发表

Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal

Degang Chen, Randall L. Geiger, Le Jin, 2007, IEEE Transactions on Instrumentation and Measurement.

System identification -based reduced-code testing for pipeline ADCs’ linearity test

Degang Chen, Hanqing Xing, Randall L. Geiger, 2008, 2008 IEEE International Symposium on Circuits and Systems.

A blind identification algorithm for digital calibration of pipelined ADC

Degang Chen, Randall L. Geiger, Le Jin, 2002, The 2002 45th Midwest Symposium on Circuits and Systems, 2002. MWSCAS-2002..

Low Cost Dynamic Test Methodology for High Precision ΣΔ ADCs

Abhijit Chatterjee, Vishwanath Natarajan, Le Jin, 2009, 2009 Asian Test Symposium.

Fast implementation of a linearity test approach for high-resolution ADCs using non-linear ramp signals

Degang Chen, Randall L. Geiger, Le Jin, 2004, 2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512).

Testing ADC Spectral Performance Without Dedicated Data Acquisition

Degang Chen, Le Jin, Jingbo Duan, 2012, IEEE Transactions on Instrumentation and Measurement.

Application of the Kalman Filter in Linearity Testing of Analog-to-Digital Converters

Le Jin, Le Jin, 2011, J. Electron. Test..

An SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli

Degang Chen, Randall L. Geiger, Le Jin, 2004, 2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512).

A modified histogram approach for accurate self-characterization of analog-to-digital converters

Degang Chen, Randall L. Geiger, Le Jin, 2002, 2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353).

Optimal Linearity Testing of Sigma-Delta Based Incremental ADCs Using Restricted Code Measurements

Abhijit Chatterjee, Le Jin, Sehun Kook, 2011, 2011 IEEE 17th International Mixed-Signals, Sensors and Systems Test Workshop.

A histogram based AM-BIST algorithm for ADC characterization using imprecise stimulus

Degang Chen, Randall L. Geiger, Le Jin, 2002, The 2002 45th Midwest Symposium on Circuits and Systems, 2002. MWSCAS-2002..

Experimental evaluation and validation of a BIST algorithm for characterization of A/D converter performance

Le Jin, R. Geiger, T. Kuyel, 2003, Proceedings of the 2003 International Symposium on Circuits and Systems, 2003. ISCAS '03..

Dynamic Network Selection for Multicast Services in Wireless Cooperative Networks

Liang Chen, Lenan Wu, Feng He, 2008, IEICE Trans. Commun..

Linearity testing of precision analog-to-digital converters using stationary nonlinear inputs

Degang Chen, Randall L. Geiger, Le Jin, 2003, International Test Conference, 2003. Proceedings. ITC 2003..

Linearity Test Time Reduction for Analog-to-Digital Converters Using the Kalman Filter with Experimental Parameter Estimation

Le Jin, Le Jin, 2008, 2008 IEEE International Test Conference.

A power-of-two FFT algorithm and structure for DRM receiver

Lin Liang, Le Jin, 2010, IEEE Transactions on Consumer Electronics.

Review on the Recent Development of Multi-mode Combined Detonation Engine

Ke Wang, Zhan Gao, Le Jin, 2013 .

A self-calibrated bandgap voltage reference with 0.5 ppm//spl deg/C temperature coefficient

Degang Chen, Hanqing Xing, Randall L. Geiger, 2006, 2006 IEEE International Symposium on Circuits and Systems.

Testing of Precision DACs Using Low-Resolution ADCs with Dithering

Degang Chen, Randall L. Geiger, Le Jin, 2006, 2006 IEEE International Test Conference.

Robust design of high gain amplifiers using dynamical systems and bifurcation theory

Degang Chen, Randall L. Geiger, Le Jin, 2004, 2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512).

High-performance ADC linearity test using low-precision signals in non-stationary environments

Degang Chen, Randall L. Geiger, Le Jin, 2005, IEEE International Conference on Test, 2005..

Testing of Precision DAC Using Low-Resolution ADC With Wobbling

Degang Chen, Randall L. Geiger, Le Jin, 2008, IEEE Transactions on Instrumentation and Measurement.

INL based dynamic performance estimation for ADC BIST

Degang Chen, Le Jin, Jingbo Duan, 2010, Proceedings of 2010 IEEE International Symposium on Circuits and Systems.

Robust High-Gain Amplifier Design Using Dynamical Systems and Bifurcation Theory With Digital Postprocessing Techniques

Degang Chen, Randall L. Geiger, Le Jin, 2007, IEEE Transactions on Circuits and Systems I: Regular Papers.

A new method for estimating spectral performance of ADC from INL

Degang Chen, Le Jin, Jingbo Duan, 2010, 2010 IEEE International Test Conference.

Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal

Degang Chen, Randall L. Geiger, Le Jin, 2009, 25th IEEE VLSI Test Symposium (VTS'07).

A blind identification approach to digital calibration of analog-to-digital converters for built-in-self-test

Degang Chen, Randall L. Geiger, Le Jin, 2002, 2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353).

A test strategy for time-to-digital converters using dynamic element matching and dithering

Degang Chen, Wenbo Liu, Hanqing Xing, 2005, 2005 IEEE International Symposium on Circuits and Systems.

Linearity Test of Analog-to-Digital Converters Using Kalman Filtering

Degang Chen, Randall L. Geiger, Le Jin, 2006, 2006 IEEE International Test Conference.

Preliminary Studies on a Small-Scale Single-Tube Pulse Detonation Rocket Prototype

Ke Wang, Le Jin, Wei Fan, 2013 .

A digital self-calibration algorithm for ADCs based on histogram test using low-linearity input signals

Degang Chen, Randall L. Geiger, Le Jin, 2005, 2005 IEEE International Symposium on Circuits and Systems.

Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal

Degang Chen, Randall L. Geiger, Le Jin, 2005, IEEE Transactions on Instrumentation and Measurement.

Grey Synthetical Prediction Model of Military Logistics Based on Evolutionary Neural Network

Jin Yu, Le Jin, Yunming Qiu, 2009, 2009 International Joint Conference on Computational Sciences and Optimization.

Characterization of a current-mode bandgap circuit structure for high-precision reference applications

Degang Chen, Hanqing Xing, Randall L. Geiger, 2006, 2006 IEEE International Symposium on Circuits and Systems.