T. Nishi

OCT with a Visible Broadband Light Source Applied to High-Resolution Nondestructive Inspection for Semiconductor Optical Devices

Y. Sugimoto, N. Ikeda, E. Watanabe, 2020, Optical Coherence Tomography and Its Non-medical Applications.

High-resolution and nondestructive profile measurement by spectral-domain optical coherence tomography with a visible broadband light source for optical-device fabrication

Y. Sugimoto, N. Ikeda, E. Watanabe, 2016 .

Phonon transport properties depending on crystal orientation analyzed by nanoindentation using single-crystal silicon wafers

M. Takashiri, H. Murotani, S. Miyake, 2021, Applied Physics Express.