Robert C. Baumann

Neutron-induced 10B fission as a major source of soft errors in high density SRAMs

Robert C. Baumann, Eric B. Smith, R. Baumann, 2001, Microelectron. Reliab..

Thermal Neutrons: a Possible Threat for Supercomputers and Safety Critical Applications

Christopher Frost, Philippe Olivier Alexandre Navaux, Robert C. Baumann, 2020, 2020 IEEE European Test Symposium (ETS).

An Overview of the Risk Posed by Thermal Neutrons to the Reliability of Computing Devices

Philippe Olivier Alexandre Navaux, Robert C. Baumann, Sean Blanchard, 2020, 2020 50th Annual IEEE-IFIP International Conference on Dependable Systems and Networks-Supplemental Volume (DSN-S).

From COTS to space grade electronics-improving reliability for Harsh environments

Robert C. Baumann, 2014 .

Determining the impact of alpha-particle-emitting contamination from the Fukushima Daiichi disaster on Japanese manufacturing sites

Robert C. Baumann, R. Baumann, 2011, 2011 12th European Conference on Radiation and Its Effects on Components and Systems.

Effects of Energy-Deposition Variability on Soft Error Rate Prediction

Nicholas C. Hooten, Robert C. Baumann, Ronald D. Schrimpf, 2015, IEEE Transactions on Nuclear Science.

Determining the Impact of Alpha-Particle-Emitting Contamination From the Fukushima-Daiichi Disaster on Japanese Semiconductor Manufacturing Sites

Robert C. Baumann, 2012, IEEE Transactions on Nuclear Science.

High-Energy Versus Thermal Neutron Contribution to Processor and Memory Error Rates

Robert C. Baumann, Daniel Oliveira, Paolo Rech, 2020, IEEE Transactions on Nuclear Science.

Contribution of low-energy (≪ 10 MeV) neutrons to upset rate in a 65 nm SRAM

Robert C. Baumann, Ronald D. Schrimpf, Robert A. Reed, 2010, 2010 IEEE International Reliability Physics Symposium.