C. Hora

Diagnosis of Local Spot Defects in Analog Circuits

Camelia Hora, Salvador Mir, Ke Huang, 2012, IEEE Transactions on Instrumentation and Measurement.

Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example

Camelia Hora, Bratislav Tasic, Bram Kruseman, 2011, 2011 Design, Automation & Test in Europe.

Extending gate-level diagnosis tools to CMOS intra-gate faults

Xinyue Fan, Will R. Moore, Camelia Hora, 2007, IET Comput. Digit. Tech..

A gate-level method for transistor-level bridging fault diagnosis

G. Gronthoud, M. Konijnenburg, W. Moore, 2006, 24th IEEE VLSI Test Symposium.

A novel stuck-at based method for transistor stuck-open fault diagnosis

Xinyue Fan, Will R. Moore, Camelia Hora, 2005, IEEE International Conference on Test, 2005..

Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages

Camelia Hora, Bram Kruseman, Ananta K. Majhi, 2007, 25th IEEE VLSI Test Symposium (VTS'07).