Hsin-Wen Ting

Transition-Code Based Linearity Test Method for Pipelined ADCs With Digital Error Correction

Hsin-Wen Ting, Soon-Jyh Chang, Jin-Fu Lin, 2011, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

An overkill detection system for improving the testing quality of semiconductor

Hsin-Wen Ting, Chi-Ming Hsu, Chin-Ming Hsu, 2012, 2012 International Conference on Information Security and Intelligent Control.

Analyses of Splittable Amplifier Technique and Cancellation of Memory Effect for Opamp Sharing

Bin-Da Liu, Hsin-Wen Ting, Soon-Jyh Chang, 2017, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Analysis of Nonideal Behaviors Based on INL/DNL Plots for SAR ADCs

Hsin-Wen Ting, Soon-Jyh Chang, Chun-Po Huang, 2016, IEEE Transactions on Instrumentation and Measurement.