Naim Ben-Hamida

Closing the gap between analog and digital testing

Bozena Kaminska, Khaled Saab, Naim Ben-Hamida, 2001, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Parametric fault simulation and test vector generation

B. Kaminska, B. Kaminska, K. Saab, 2000, Proceedings Design, Automation and Test in Europe Conference and Exhibition 2000 (Cat. No. PR00537).

Epilepsy seizure prediction using graph theory

Larbi Talbi, Ahmed Lakhssassi, Tahar Haddad, 2014, 2014 IEEE 12th International New Circuits and Systems Conference (NEWCAS).

A perturbation based fault modeling and simulation for mixed-signal circuits

Bozena Kaminska, David Marche, Khaled Saab, 1997, Proceedings Sixth Asian Test Symposium (ATS'97).

LIMSoft: automated tool for design and test integration of analog circuits

Bozena Kaminska, David Marche, Khaled Saab, 1996, Proceedings International Test Conference 1996. Test and Design Validity.

Analog circuit testing based on sensitivity computation and new circuit modeling

Bozena Kaminska, Naim Ben-Hamida, B. Kaminska, 1993, Proceedings of IEEE International Test Conference - (ITC).

Temporal epilepsy seizures monitoring and prediction using cross-correlation and chaos theory.

Ahmed Lakhssassi, Sadok Aouini, Naim Ben-Hamida, 2014, Healthcare technology letters.

A 56GS/S 6b DAC in 65nm CMOS with 256×6b memory

Marinette Besson, Peter Schvan, Jorge Aguirre, 2011, 2011 IEEE International Solid-State Circuits Conference.

A 40GS/s 6b ADC in 65nm CMOS

Marinette Besson, Peter Schvan, Jorge Aguirre, 2010, 2010 IEEE International Solid-State Circuits Conference - (ISSCC).