N. Nagi

Test metrics for analog parametric faults

Stephen K. Sunter, Naveena Nagi, S. Sunter, 1999, Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146).

Hierarchical fault modeling for analog and mixed-signal circuits

Jacob A. Abraham, Naveena Nagi, J. Abraham, 1992, Digest of Papers. 1992 IEEE VLSI Test Symposium.

Fault simulation of linear analog circuits

Abhijit Chatterjee, Jacob A. Abraham, Naveena Nagi, 1993, J. Electron. Test..

A unified approach for fault simulation of linear mixed-signal circuits

Abhijit Chatterjee, Jacob A. Abraham, Hong Zheng, 1996, J. Electron. Test..

Design for testability and built-in self-test of mixed-signal circuits: a tutorial

Abhijit Chatterjee, Naveena Nagi, A. Chatterjee, 1997, Proceedings Tenth International Conference on VLSI Design.

Fault-based automatic test generator for linear analog circuits

Abhijit Chatterjee, Jacob A. Abraham, Ashok Balivada, 1993, Proceedings of 1993 International Conference on Computer Aided Design (ICCAD).