G. Pascariu

The cavity perturbation method for the measurement of the relative dielectric permittivity in the microwave range

I. Dumitru, D. Sandu, S. Balmus, 2006 .

Characterization of dielectric mixtures by the time domain reflectometry (TDR)

D. Sandu, S. Balmus, G. Pascariu, 2006 .

Next generation electronics packaging utilizing flip chip technology

D. Crowley, G. Pascariu, P. Cronin, 2003, IEEE/CPMT/SEMI 28th International Electronics Manufacturing Technology Symposium, 2003. IEMT 2003..