J. Roach

Low-frequency noise as a tool for characterization of near-band impurities in silicon

F. J. Scholz, J. W. Roach, F. Scholz, 1992 .

Frequency dispersion of sidegating transconductance of GaAs junction field‐effect transistors

R. Zuleeg, H. Wieder, J. Roach, 1985 .

Space-charge-limited currents and trapping in semi-insulating InP

H. Wieder, J. Roach, 1985, IEEE Electron Device Letters.