J. Kelly

发表

The use of synchrotron edge topography to study polytype nearest neighbour relationships in SiC

P. Barnes, G. Fisher, J. Kelly, 1995 .

Observation of fine one-dimensionally-disordered layers in silicon carbide

P. Barnes, J. Kelly, G. R. Chikusa, 1991 .

Correlation between layer thickness and periodicity of long polytypes in silicon carbide

P. Barnes, G. Fisher, J. Kelly, 2005 .

Long period polytype boundaries in silicon carbide

G. Fisher, P. Barnes, J. Kelly, 2001 .

Dislocation Contrast in White-Radiation Synchrotron Topography of Silicon Carbide

P. Barnes, G. Fisher, J. Kelly, 1993 .

The use of synchrotron radiation X-ray diffraction topography to determine the spatial distribution of polytypes and one dimensional disorder in SiC

P. Barnes, G. Fisher, J. Kelly, 1993 .

Dislocation distributions in ion implanted optical waveguides

P. J. Chandler, P. Haycock, P. Barnes, 1994 .