Ruofei Hu

Efficient Hardware Architecture of Softmax Layer in Deep Neural Network

Shouyi Yin, Shaojun Wei, Binren Tian, 2018, 2018 IEEE 23rd International Conference on Digital Signal Processing (DSP).

Reliability of Memristive Devices for High-Performance Neuromorphic Computing: (Invited Paper)

Jianshi Tang, Xinyi Li, Yue Xi, 2023, 2023 IEEE International Reliability Physics Symposium (IRPS).

Investigation of Resistive Switching Mechanisms in Ti/TiOx/Pd‐Based RRAM Devices

Huaqiang Wu, Jianshi Tang, Xinyi Li, 2021, Advanced Electronic Materials.

Nitrogen-Oxyanion-Doped HfO2 Resistive Random-Access Memory With Chemically Enhanced Forming

Huaqiang Wu, Jianshi Tang, B. Gao, 2023, IEEE Electron Device Letters.

Optimization of Softmax Layer in Deep Neural Network Using Integral Stochastic Computation

Shouyi Yin, Shaojun Wei, Binren Tian, 2018, J. Low Power Electron..

Compact Reliability Model of Analog RRAM for Computation-in-Memory Device-to-System Codesign and Benchmark

Huaqiang Wu, Jianshi Tang, B. Gao, 2021, IEEE Transactions on Electron Devices.