K. Iwagami

CHARACTERIZATION OF CARRIER CONCENTRATION AND STRESS IN GAAS METAL-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR BY CATHODOLUMINESCENCE SPECTROSCOPY

H. Ishida, M. Yoshikawa, K. Iwagami, 1998 .

Characterization of fluorine-doped silicon dioxide film by Raman spectroscopy

H. Ishida, M. Yoshikawa, T. Matsunobe, 1997 .