K. Ostreicher

Improved method for the preparation of TiN‐coated WC‐Co‐based samples for cross‐sectional AEM investigation

J. Hefter, K. Ostreicher, C. Sung, 1992, Microscopy research and technique.

Crystalline grain boundary phase in the Y2O3-AlN-Si3N4 system

C. Sung, A. Pasto, N. Naito, 1992 .

Low substrate temperature molecular beam epitaxial growth and the critical layer thickness of InGaAs grown on GaAs

Emil S. Koteles, P. Melman, Boris S. Elman, 1991 .

Segregation of Magnesium to the Internal Surface of Residual Pores in Translucent Polycrystalline Alumina

G. C. Wei, C. Sung, W. Rhodes, 1992 .

Topographic/structure changes of implanted Si_3N_4

V. Sarin, D. Oblas, K. Ostreicher, 1992 .