C. Sung

Improved method for the preparation of TiN‐coated WC‐Co‐based samples for cross‐sectional AEM investigation

J. Hefter, K. Ostreicher, C. Sung, 1992, Microscopy research and technique.

Low substrate temperature molecular beam epitaxial growth and the critical layer thickness of InGaAs grown on GaAs

Emil S. Koteles, P. Melman, Boris S. Elman, 1991 .

Improved Adhesion of the c-BN Film by the Post ION Implantation: TEM and FTIR

S. Lee, E. Byon, C. Sung, 1998, Microscopy and Microanalysis.